O Sakata, Y Furukawa, S Goto, T Mochizuki, T Uruga, K Takeshita, H Ohashi, T Ohata, T Matsushita, S Takahashi, H Tajiri, T Ishikawa, M Nakamura, M Ito, K Sumitani, T Takahashi, T Shimura, A Saito, M Takahashi
SURFACE REVIEW AND LETTERS 10(2-3) 543-547 2003年4月 査読有り
The main components of a new beamline for surface and interface crystal structure determination at SPring-8 are briefly described. Stages for the beamline monochromator are modified for making an incident X-ray intensity more stable for surface X-ray experiments. Absolute photon flux densities were measured with an incident photon energy. A new ultrahigh vacuum system is introduced with preliminary X-ray measurements from an ordered oxygen on Pt (111) surface.