北神 正人

This paper proposes a neu class of error locating codes which corrects random single-bit errors and indicates a location of an erroneous b-bit byte which includes e-bit errors, where 2 less than or equal to e < b, called SEC - S(e/b)EL codes. This type of codes is very suitable for an application to memory systems constructed from byte-organized memory chips because this corrects random single-bit errors induced by soft-errors and also indicates the position of the faulty memory chips. This paper also gives a construction method of the proposed codes using tenser product of the two codes, i.e., the single b-bit byte error correcting codes and the single-bit error correcting and e-bit error detecting codes. This clarifies lower bounds and error control capabilities of the proposed codes.

This paper proposes a neu class of error locating codes which corrects random single-bit errors and indicates a location of an erroneous b-bit byte which includes e-bit errors, where 2 less than or equal to e < b, called SEC - S(e/b)EL codes. This type of codes is very suitable for an application to memory systems constructed from byte-organized memory chips because this corrects random single-bit errors induced by soft-errors and also indicates the position of the faulty memory chips. This paper also gives a construction method of the proposed codes using tenser product of the two codes, i.e., the single b-bit byte error correcting codes and the single-bit error correcting and e-bit error detecting codes. This clarifies lower bounds and error control capabilities of the proposed codes.