芦田極, 森田昇, 吉田嘉太郎
日本機械学会論文集 C編 1998年10月
Nano-machining expeiment is necessary for factual understanding of the nano-machining process. From this point of view, a unique nano-machining FFM system, which has very stiff cantilever for machining, has been developed. In order to grasp the characteristics of the developed system, single crystal silicon was machined using the function of line-scanning and area-scanning. As a result, two essential characters of the system have been extracted. Firstly, the shape of the traces machined by different cantilevers vary obviously because of the geometrical irregularity of the tip. And, even in case of using the same cantilever, the traces also vary little by little as repeat machining because of the wear of the cutting edge. Secondly, the depth of the trace machined by the area-scanning is about 10 times as large as the line-scanning. To explain the reason, a machining model was proposed, in which machining and removing efficiency is raised up by the feed of the scanning line. The lateral machining force changed by the type of scanning, and the shape of the cutting chips, which were observed by SEM, also vary by the feed condition. These results could prove the proposed model. ? 1998, The Japan Society of Mechanical Engineers. All rights reserved.