Technical report of IEICE. VLD 111(324) 49-54 Nov 2011
When designing a system on chip (SoC), a test access mechanism (TAM) is required to deliver test data and to collect test responses from cores under test (CUT). To facilitate the network on chip (NoC) testing, test engineers frequently focus on No...
Oishi Koshi Namba Kazuteru Ito Hideo Sumantyo Josaphat Tetuko Sri
IEICE technical report 111(323) 37-41 Nov 2011
We are developing a microsatellite with a circularly polarized synthetic aperture radar (CP-SAR) sensor. Traditionally, SAR image processing is made on the earth. In the method, large size of SAR images obtained from the sensor are disadvantageous...
IEICE technical report. Dependable computing 111(325) 49-54 Nov 2011
When designing a system on chip (SoC), a test access mechanism (TAM) is required to deliver test data and to collect test responses from cores under test (CUT). To facilitate the network on chip (NoC) testing, test engineers frequently focus on No...
IEICE technical report. Dependable computing 111(325) 121-126 Nov 2011
Scan design is one of design for testing. Chiba-Scan proposed in 2005 is one of scan design for delay fault testing. Chiba-Scan has complete fault coverage for robust and nonrobust path delay fault testing without extra latches. However, the test ...
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