T Shimada   T Suetsugu   T Miyadera   Y Yamamoto   A Koma   K Saiki   K Kudo   
APPLIED PHYSICS LETTERS 84(13) 2439-2441 2004年3月
Ultraviolet photoelectron spectroscopy (UPS) of C-60 thin-film field-effect transistors was measured with biasing gate voltages. A time-dependent change in the electronic structure of the C-60 film was, observed during the UPS measurement, which h...